Our Research facilities

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Dektak surface profilometer

Sopra spectroscopic ellipsometer

Vigor Glove box

Photothermal deflection spectrometer

Impedance analyzer

Keithley source meter

Relevant central facilities include Field Emission Scanning Electron Microscope (FESEM) and Transmission Electron Microscope (TEM), both mounted with Energy Dispersive X-ray Spectrometer (EDX), X-ray Diffractometer (XRD) and a Multi-technique Surface Analysis System equipped with X-ray Photoelectron Spectrometer (XPS) / Ultraviolet Photoelectron Spectrometer (UPS).                 

Link to Surface Analysis & Material Characterization Laboratory »

       

 

Relevant central facilities include Field Emission Scanning Electron Microscope (FESEM) and Transmission Electron Microscope (TEM), both mounted with Energy Dispersive X-ray Spectrometer (EDX), X-ray Diffractometer (XRD) and a Multi-technique Surface Analysis System equipped with X-ray Photoelectron Spectrometer (XPS) / Ultraviolet Photoelectron Spectrometer (UPS).                 

Link to Surface Analysis & Material Characterization Laboratory »

 

Dektak surface profilometer

Sopra spectroscopic ellipsometer

Vigor Glove box

Photothermal deflection spectrometer

Impedance analyzer

Keithley source meter